The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Apr. 09, 2014
Siemens Aktiengesellschaft, Munich, DE;
Jan Ole Blumhagen, Erlangen, DE;
Matthias Fenchel, Erlangen, DE;
Ralf Ladebeck, Erlangen, DE;
Harald H. Quick, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for imaging a part region of an examination object in a magnetic resonance system. In an embodiment, a first and second gradient field are respectively created such that, at a respective first and second position at the edge of the field of view, a distortion caused by a non-linearity of the respective first and second gradient field, and a distortion caused by a Bo field inhomogeneity, cancel each other out. By way of the respective first and second gradient, respective first and second magnetic resonance data which contains the respective first and second position are acquired. A first and second respective readout direction, in which the respective first and second magnetic resonance data are acquired, are selected as a function of a location of the respective first and second position. From the magnetic resonance data, an image of the part region is defined.