The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Sep. 09, 2016
General Electric Company, Schenectady, NY (US);
York Oberdoerfer, Lagenfeld, DE;
Weiwei Zhang, Huerth, DE;
General Electric Company, Schenectady, NY (US);
Abstract
A non-destructive testing system for testing a work piece. The non-destructive testing system includes an ultrasonic probe, including a matrix of transducers, and a control unit including a display. The control unit is configured to control the ultrasonic probe. The ultrasonic probe and the control unit are configured to obtain multiple S-scan images. The ultrasonic probe and the control unit are configured to obtain a first S-scan image at a first direction orientation, and the ultrasonic probe and the control unit are configured to obtain a second S-scan image at a second direction orientation different from the first direction orientation. The control unit is configured to process the first and second S-scan images to provide at least an image upon the display.