The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Jan. 24, 2014
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

ShiJie Wen, Sunnyvale, CA (US);

Richard J. Wong, Saratoga, CA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/02 (2006.01);
U.S. Cl.
CPC ...
G01N 23/02 (2013.01); G01N 2223/313 (2013.01); G01N 2223/314 (2013.01); G01N 2223/6113 (2013.01); G01N 2223/646 (2013.01);
Abstract

Masks that selectively attenuate radiation for inspections of printed circuit boards (PCB) are disclosed. A PCB may be inspected for defects by exposing the PCB with radiation and analyzing the radiation transmitted through the PCB. By employing a radiation mask having first and second segments between the PCB and a radiation source, the radiation may be selectively attenuated to attenuate a first portion of the radiation with a first attenuation level to prevent performance degradation to sensitive semiconductor devices as part of a first sectional area of the PCB, and yet provide substantially non-attenuation or attenuation at a second attenuation level for a second portion of the radiation incident upon a second sectional area of the PCB which is free from sensitive semiconductor devices. In this manner, the selective attenuation enables inspection of the first and second sectional areas of the PCB without damage to the sensitive semiconductor devices.


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