The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Mar. 07, 2017
Daylight Solutions Inc., San Diego, CA (US);
Benjamin Bird, Roslindale, MA (US);
Miles James Weida, Poway, CA (US);
Jeremy Rowlette, Redwood City, CA (US);
DAYLIGHT SOLUTIONS, INC., San Diego, CA (US);
Abstract
Spectrally analyzing an unknown sample (A) for the existence of a characteristic includes (i) analyzing a first known sample (C) having the characteristic and a second known sample (D) not having the characteristic to identify less than fifty diagnostic spectral features, each diagnostic spectral feature being present at a different diagnostic wavelength in a mid-infrared spectral region; (ii) directing a plurality of interrogation beams () at the unknown sample (A), each of the interrogation beams () having a different interrogation wavelength, and each interrogation wavelength corresponding to a different one of the diagnostic wavelengths; (iii) acquiring a plurality of separate output images () of the unknown sample (A), wherein each of the output images () is acquired while the unknown sample is illuminated by a different one of the interrogation beams (); and (iv) analyzing less than fifty output images () with a control system () to determine whether the characteristic is present in the unknown sample (A).