The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Aug. 11, 2015
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventor:

Ralf Bitter, Karlsruhe, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 33/00 (2006.01); G01N 21/3504 (2014.01); G01J 3/433 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01J 3/433 (2013.01); G01N 21/3504 (2013.01); G01N 21/39 (2013.01); G01N 33/0073 (2013.01); G01N 2201/061 (2013.01);
Abstract

Absorption spectrometer and method for measuring the concentration of a gaseous component of interest in a measurement gas, wherein to compensate influence of changes in an optical path length in the absorption spectrometer on a measured result, light from the laser is modulated with at least one pilot frequency in the MHz range, the measurement signal is analyzed in a phase-sensitive manner for the pilot frequency, phase information obtained during this analysis is compared with phase information obtained during calibration of the absorption spectrometer, where the measured result is corrected as a function of the difference between the two items of phase information. Alternatively, light from the laser is modulated with two pilot frequencies, where signal components contained in the measurement signal with the pilot frequencies are detected in a phase-sensitive manner and the difference between the phase information of the two signal components obtained in this operation is analyzed.


Find Patent Forward Citations

Loading…