The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Feb. 02, 2017
Horiba, Ltd., Kyoto-shi, Kyoto, JP;
Tetsuji Yamaguchi, Kyoto, JP;
Tetsuya Mori, Kyoto, JP;
HORIBA, LTD., Kyoto, JP;
Abstract
Provided is a dynamic light scattering type particle size distribution measuring apparatuscapable of accurately measure the particle sizes of a sample obtained from slurry or the like. The dynamic light scattering type particle size distribution measuring apparatusis configured to include: a filter memberthat is interposed between any adjacent two of a light source, a cell, and a photodetectorand attenuates light passing therethrough; and an information processing devicethat measures a particle size distribution multiple times with time and combines particle size distributions obtained at respective times of measurement to thereby calculate the particle size distribution of the whole of portions of the sample introduced at the respective times of measurement. In addition, the filter memberis also configured to be changeable to one having a different attenuation level at every time of measurement.