The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Sep. 11, 2012
David Michael Spriggs, Malvern, GB;
Duncan Stephenson, Malvern, GB;
David Michael Spriggs, Malvern, GB;
Duncan Stephenson, Malvern, GB;
Malvern Instruments Limited, Malvern, GB;
Abstract
Apparatus () for measuring particle size distribution by light scattering comprises a blue LED () and a 633 nm helium neon laser (). Light output from the LED and laser is separately passed or reflected by a dichroic element () onto a common path through a sample cell () containing a sample, the particle size distribution of which is to be measured. Light scattered from the sample cell is detected by one or more detectors (B-H). Light transmitted by the sample cell is detected by detectorsA,J. Output signals from one or more of the detectors are passed to a computation unit () which calculates particle size distribution. A small percentage of light from the blue LED is reflected by the dichroic element to a detector (). Similarly, a small percentage of light from the laser is passed by the dichroic element to the detector. Output signals from the detector are fed back to control units () to stabilize the output power of the LED and laser.