The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Apr. 21, 2016
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Sudeep Mandal, Niskayuna, NY (US);

Susanne Madeline Lee, Cohoes, NY (US);

Sachin Narahari Dekate, Niskayuna, NY (US);

Majid Nayeri, Niskayuna, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01); G01J 5/48 (2006.01);
U.S. Cl.
CPC ...
G01M 11/319 (2013.01); G01N 21/00 (2013.01); G01J 5/48 (2013.01);
Abstract

A measurement system includes a cable having a length, a light source, at least one detector, and at least one processor. The light source is operably coupled to the cable and is configured to transmit an optical signal to the cable. The at least one processor is operably coupled to the cable and configured to: receive a scattered signal from the cable responsive to the optical signal transmitted to the cable; map the scattered signal to the length of the cable; and de-convolve a spatial averaging effect of the scattered signal using a weighting profile corresponding to the light source and the cable to generate a distributed property profile defined along the length of the cable.


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