The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Aug. 22, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Shigeharu Kimura, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G02F 1/365 (2006.01); G02F 1/35 (2006.01); G01J 3/02 (2006.01); G01N 21/65 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01J 3/44 (2013.01); G01J 3/0208 (2013.01); G01J 3/0218 (2013.01); G01N 21/65 (2013.01); G02B 21/002 (2013.01); G02B 21/0056 (2013.01); G02F 1/353 (2013.01); G02F 1/365 (2013.01); G01N 2021/653 (2013.01); G02F 2001/3528 (2013.01);
Abstract

To measure homodyne interference with a CARS microscope, a supercontinuum beam is used as a light source. A supercontinuum beam is generated using a nonlinear optical fiber that has normal dispersion in which the coherence between pulses is maintained. As the phases of the interference components of detected beams are the same between pulses, it is possible to integrate the interference components and thus improve the signal-noise ratio.


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