The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Oct. 27, 2016
Applicant:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Inventors:

Mikio L. Yujiri, Manhattan Beach, CA (US);

Hiroshi Agravante, Long Beach, CA (US);

John C. Donovan, Norwalk, CA (US);

Assignee:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/00 (2006.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01J 2001/448 (2013.01);
Abstract

An apparatus includes: a focal plane array (FPA) of receivers for a passive millimeter wave camera, the FPA comprising: receivers configured to sample an image, the image comprising one or more regions, the receivers arranged in an array of dimensions m rows by n columns, and a scanning reflector configured to move, thereby moving an image of the scene across the FPA transverse to the receiver columns.


Find Patent Forward Citations

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Yujiri, Mikio. (2018). Image scanning on a sparsely populated focal plane array to achieve nyquist sampling (U.S. Patent No. 9869583). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9869583

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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