The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Apr. 21, 2014
Applicant:

Axsun Technologies Llc, Billerica, MA (US);

Inventors:

Brian Goldberg, Cambridge, MA (US);

Bartley C. Johnson, North Andover, MA (US);

Assignee:

Axsun Technologies, Inc., Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02083 (2013.01); G01B 9/02004 (2013.01); G01B 9/02069 (2013.01); G01B 9/02091 (2013.01);
Abstract

A system and method for resampling interference datasets of samples in segments, in a swept-source based Optical Coherence Tomography (OCT) system. The resampling is preferably performed within a Field Programmable Gate Array (FPGA) of the OCT system, the FPGA preferably having Fourier-transform based signal processing capabilities such as Fast Fourier Transform (FFT) cores. Resampling the interference datasets in segments provides a flexible approach to resampling that makes efficient use of system resources such as FFT cores. By resampling the interference datasets in segments, the system adjusts to an increased number of resampling points as the imaging depth upon the sample increases. The OCT system then combines the segments using overlapping values of the resampling points between adjacent resampling regions of the resampled segments, and performs Fourier Transform based post-processing on the combined segments to obtain axial profiles of the sample at desired imaging depths.


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