The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Jul. 18, 2016
Medlumics S.l., Madrid, ES;
Eduardo Margallo Balbás, Madrid, ES;
José Luis Rubio Guivernau, Madrid, ES;
Medlumics S.L., Madrid, ES;
Abstract
A system for optical coherence tomography using multiple interferometers presented. The interferometry system includes a source configured to generate a variable wavelength light beam. A first splitter is configured to split the variable wavelength light beam to at least a first light beam and a second light beam. A first delay element is configured to delay the first light beam by a first time delay. A second delay element is configured to delay the second light beam by a second time delay, such that the delayed first light beam and the delayed second light beam are out of coherence with each other. A first interferometer is configured to receive the delayed first light beam as an input. A second interferometer is configured to receive the delayed second light beam as an input.