The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Nov. 23, 2016
Applicant:

Noporvis Co., Ltd., Kaohsiung, TW;

Inventors:

Wei-Hung Su, Kaohsiung, TW;

Hui-Hung Lin, Tainan, TW;

Kuo-Kai Hung, Tainan, TW;

Chun-Neng Chan, Kaohsiung, TW;

Lu-Yu Wang, Tainan, TW;

Assignee:

NOPORVIS CO., LTD., Kaosiung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); B23Q 17/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02001 (2013.01); B23Q 17/00 (2013.01); G01B 9/02015 (2013.01); G01B 9/02057 (2013.01); G01B 2290/70 (2013.01);
Abstract

A displacement measuring device includes an optical module for refracting or reflecting light; a beam splitting module including a polarizing beam splitting layer for allowing light with a first polarization direction to pass through and reflecting light with a second polarization direction; a light source for generating a first light beam with the first polarization direction and a second light beam with the second polarization direction, wherein the first light beam is reflected by a measured object after passing through the optical module and the beam splitting module, and the second light beam is reflected by the polarizing beam splitting layer after passing through the optical module; an image sensor for sensing an interference pattern generated by the reflected first and second light beams; and a processing unit for calculating a displacement value of the measured object according to the interference pattern.


Find Patent Forward Citations

Loading…