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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9868097 B1

PDFFull Text
Date of Patent:
Jan. 16, 2018

Filed:

Mar. 03, 2015

Method for reducing critical micelle concentration, and surfactant composition

Applicants:

Kaneka Corporation, Osaka-shi, Osaka, JP;

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Satohiro Yanagisawa, Tokyo, JP;

Takuto Nagano, Osaka, JP;

Masashi Izumida, Takasago, JP;

Toshiaki Taira, Tsukuba, JP;

Tomohiro Imura, Tsukuba, JP;

Dai Kitamoto, Tsukuba, JP;

Assignees:

KANEKA CORPORATION, Osaka-shi, Osaka, JP;

NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;

Attorney:

Birch, Stewart, Kolasch & Birch, LLP

Primary Examiner:

Raymond J Henley, III

Int. Cl.
CPC ...
A61K 38/08 (2006.01); A61K 47/00 (2006.01); B01F 17/00 (2006.01); A61K 8/64 (2006.01); A61K 47/20 (2006.01); C11D 1/10 (2006.01); A61K 47/18 (2017.01); A61Q 19/00 (2006.01); A23L 33/10 (2016.01); A23L 2/52 (2006.01); A61K 8/46 (2006.01); A61K 47/42 (2017.01); C05G 3/00 (2006.01); C09D 7/12 (2006.01); C11D 1/00 (2006.01); C11D 1/22 (2006.01); D21H 17/09 (2006.01); D21H 17/20 (2006.01); D21H 27/20 (2006.01); A61K 8/36 (2006.01); A61K 8/70 (2006.01); A61Q 5/02 (2006.01); A61Q 11/00 (2006.01); A61Q 15/00 (2006.01); A61Q 17/04 (2006.01);
U.S. Cl.
CPC ...
B01F 17/005 (2013.01); A23L 2/52 (2013.01); A23L 33/10 (2016.08); A61K 8/361 (2013.01); A61K 8/463 (2013.01); A61K 8/466 (2013.01); A61K 8/64 (2013.01); A61K 8/70 (2013.01); A61K 47/183 (2013.01); A61K 47/20 (2013.01); A61K 47/42 (2013.01); A61Q 19/00 (2013.01); B01F 17/0057 (2013.01); B01F 17/0085 (2013.01); C05G 3/00 (2013.01); C09D 7/125 (2013.01); C09D 7/1233 (2013.01); C11D 1/008 (2013.01); C11D 1/10 (2013.01); C11D 1/22 (2013.01); D21H 17/09 (2013.01); D21H 17/20 (2013.01); D21H 27/20 (2013.01); A23V 2002/00 (2013.01); A61K 2800/10 (2013.01); A61K 2800/596 (2013.01); A61Q 5/02 (2013.01); A61Q 11/00 (2013.01); A61Q 15/00 (2013.01); A61Q 17/04 (2013.01); A61Q 19/007 (2013.01);
Abstract

The objective of the present invention is to provide a method for remarkably reducing a critical micelle concentration of an anionic surfactant, which is used in a large amount currently, to reduce the amount to be used. Also, the objective of the present invention is to provide a surfactant composition of which whole critical micelle concentration is remarkably reduced and in which an amount of an anionic surfactant is reduced in comparison with the case of using an anionic surfactant only as a surfactant. The method for reducing a critical micelle concentration of an anionic surfactant according to the present invention is characterized in using a cyclic lipopeptide biosurfactant in combination with the anionic surfactant.

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