The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Apr. 02, 2012
Yan Seng Elijah Yew, Singapore, SG;
Heejin Choi, Brookline, MA (US);
Vijay Raj Singh, Singapore, SG;
Daekeun Kim, Seoul, KR;
Jagath Rajapakse, Singapore, SG;
Hanry Yu, Singapore, SG;
Colin J. R. Sheppard, Singapore, SG;
Peter T. C. SO, Boston, MA (US);
Yan Seng Elijah Yew, Singapore, SG;
Heejin Choi, Brookline, MA (US);
Vijay Raj Singh, Singapore, SG;
Daekeun Kim, Seoul, KR;
Jagath Rajapakse, Singapore, SG;
Hanry Yu, Singapore, SG;
Colin J. R. Sheppard, Singapore, SG;
Peter T. C. So, Boston, MA (US);
NANYANG TECHNOLOGICAL UNIVERSITY, Singapore, SG;
NATIONAL UNIVERSITY OF SINGAPORE, Singapore, SG;
MASSACHUSETTS INSTITUTE OF TECHNOLOGY, Cambridge, MA (US);
Abstract
An imaging system is provided that includes a pulsed light source providing pulsed light and is applicable to both microscopes and endoscopes. One or more optical elements with certain dispersive properties are positioned to receive the pulsed light and apply selective dispersive properties to shift the focal plane according to the user and to produce two photon (2p) wide field uniform illumination and 2p wide field structured illumination for the purpose of improving the optical axial resolution and rejection of background signal. An imaging element receives the signal arising from the 2p wide field uniform illumination and 2p wide field structured illumination and produces a respective 3D resolved image of a sample.