The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Feb. 18, 2016
Keyence Corporation, Osaka, JP;
Hiroyuki Satoyoshi, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
There are provided an optical displacement measurement system, an imaging condition optimization method, and an imaging condition optimization program which facilitate setting of an optimal imaging condition. States of a plurality of imaging parameters for setting an imaging condition are set by an imaging setting unit. When the set state of any of the plurality of imaging parameters is changed, a plurality of pieces captured image data according to respective imaging conditions are generated by a light receiving unit. Profile data indicating a profile shape is generated by a profile generation unit based on each piece of generated captured image data. Based on each piece of generated profile data or captured image data corresponding to the profile data, a degree of reliability of a profile shape indicated by the profile data is calculated by a reliability calculation unit.