The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Sep. 27, 2013
Emc Corporation, Hopkinton, MA (US);
Vitaly Stanislavovich Kozlovsky, Saint Petersburg, RU;
Dmitry Nikolayevich Tylik, Saint Petersburg, RU;
Eugeny Alexeevich Novozhilov, Saint Petersburg, RU;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Improved techniques involve comparing access patterns in a storage system to expected access patterns under similar circumstances. An intrusion detection system, in response to a suspected malicious application workload, collects information about a current session on the storage processor, e.g., application workload s running, users logged in, and timestamp, as well as parameters such as storage allocation requests sampled at prespecified intervals over a period of time. In a database that stores such sampled parameter values by application workload, user, and time, the system extracts the sampled parameter values having the application workload, user, and time corresponding to the current session. The system then compares the extracted sampled parameter values with the current parameter values and computes a difference. Based on the difference, the system determines whether the storage system is accessed by a malicious application workload.