The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Mar. 14, 2013
Applicant:

Leco Corporation, St. Joseph, MI (US);

Inventors:

Anatoly N. Verenchikov, St. Petersburg, RU;

Mikhail I. Yavor, St. Petersburg, RU;

Assignee:

LECO Corporation, St. Joseph, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/406 (2013.01); H01J 49/067 (2013.01); H01J 49/405 (2013.01);
Abstract

To improve spatial and energy acceptance of multi-reflecting time-of-flight, open traps, and electrostatic trap analyzers, a novel ion mirror is disclosed. Incorporation of immersion lens between ion mirrors allows reaching the fifth order time per energy focusing simultaneously with the third order time per spatial focusing including energy-spatial cross terms. Preferably the analyzer has hollow cylindrical geometry for extended flight path. The time-of-flight analyzer preferably incorporates spatially modulated ion mirror field for isochronous ion focusing in the tangential direction.


Find Patent Forward Citations

Loading…