The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Aug. 21, 2014
Applicant:

Thermo Fisher Scientific (Bremen) Gmbh, Bremen, DE;

Inventors:

Nicolaie Eugen Damoc, Bremen, DE;

Eduard Denisov, Bremen, DE;

Dirk Nolting, Bremen, DE;

Martin Zeller, Bremen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/40 (2006.01); H01J 49/42 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0422 (2013.01); H01J 49/005 (2013.01); H01J 49/0031 (2013.01); H01J 49/0077 (2013.01); H01J 49/40 (2013.01); H01J 49/4245 (2013.01); H01J 49/4265 (2013.01); G01N 27/622 (2013.01);
Abstract

The present disclosure provides a mass spectrometer for performing an analysis of sample ions, and a method for operating a mass spectrometer. The mass spectrometer comprises a first ion optical element that is supplied with a first gas; a mass analyzer, wherein the performance of the mass analyzer is dependent on the pressure of the first gas in the first ion optical element; and a controller for setting a property of the first gas, which comprises at least the pressure of the first gas, on the basis of a characteristic of the analysis to be performed by the mass spectrometer.


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