The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

May. 08, 2017
Applicant:

Analytical Graphics, Inc., Exton, PA (US);

Inventors:

Austin Eng, Philadelphia, PA (US);

Sean Lilley, Exton, PA (US);

Daniel Bagnell, Exton, PA (US);

Patrick Cozzi, Drexel Hill, PA (US);

Assignee:

Analytical Graphics, Inc., Exton, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 17/00 (2006.01); G06T 17/10 (2006.01); G06T 15/40 (2011.01);
U.S. Cl.
CPC ...
G06T 17/005 (2013.01); G06T 15/405 (2013.01); G06T 17/10 (2013.01);
Abstract

Systems and methods for three dimensional modeling using skipping heuristics and fusing are disclosed herein. An example method includes obtaining a plurality of three dimensional models of a target, each of the models having a unique resolution level, assembling an aggregate three dimensional model using a hierarchical tree representation of the plurality of three dimensional models by skipping levels of detail in the hierarchical tree and rendering the levels of the hierarchical tree that were not skipped. Fusing overlapping sections of the aggregate model can be accomplished using bivariate visibility testing.


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