The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Mar. 04, 2016
Ricoh Company, Ltd., Tokyo, JP;
M. Dirk Robinson, Menlo Park, CA (US);
Junlan Yang, Chicago, IL (US);
David G. Stork, Portola Valley, CA (US);
Wanmin Wu, Foster City, CA (US);
Patrick Llull, Durham, NC (US);
Ivana Tosic, San Francisco, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Noah Bedard, Pacifica, CA (US);
Ricoh Company, Ltd., Tokyo, JP;
Abstract
Multiframe reconstruction combines a set of acquired images into a reconstructed image. Here, which images to acquire are selected based at least in part on the content of previously acquired images. In one approach, a set of at least three images of an object are acquired at different acquisition settings. For at least one of the images in the set, the acquisition setting for the image is determined based at least in part on the content of previously acquired images. Multiframe image reconstruction, preferably via a multi-focal display, is applied to the set of acquired images to synthesize a reconstructed image of the object.