The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Feb. 28, 2013
Applicant:
Accenture Global Services Limited, Dublin, IE;
Inventors:
Dennis Carroll, Leander, TX (US);
Anh-Hoang Vo, Austin, TX (US);
German Acuna, Austin, TX (US);
Cecil O. Lynch, Granite Bay, CA (US);
Erica Creen, Chicago, IL (US);
Assignee:
ACCENTURE GLOBAL SERVICES LIMITED, Dublin, IE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06F 19/322 (2013.01); G06F 19/327 (2013.01); G06F 19/3431 (2013.01); G06F 19/3487 (2013.01); G06Q 10/0633 (2013.01);
Abstract
A clinical quality analytics system may include a data storage to store electronic medical record (EMR) data. The system may map events from the EMR data to a process map through a recursive matching process. The mapping may include recursively matching the events to nodes in threads in a map based on event times and thread times. One of the recursions may be selected as a best fit based on metrics determined for the recursions.