The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Mar. 14, 2014
Etegent Technologies Ltd., Cincinnati, OH (US);
Joseph M. Kesler, Cincinnati, OH (US);
Thomas D. Sharp, Terrace Park, OH (US);
Uriah M. Liggett, Independence, KY (US);
Brian Bahr, Cincinnati, OH (US);
Chris M. Hodapp, Reading, OH (US);
Gary E. Coyan, Terrace Park, OH (US);
Etegent Technologies Ltd., Cincinnati, OH (US);
Abstract
Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.