The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Feb. 26, 2014
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Takayoshi Togino, Tokyo, JP;

Ikutoshi Fukushima, Tokyo, JP;

Yasushi Namii, Tokyo, JP;

Mitsujiro Konno, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 23/24 (2006.01); G02B 13/04 (2006.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
G02B 23/2415 (2013.01); A61B 1/00193 (2013.01); G02B 13/04 (2013.01); G02B 23/243 (2013.01);
Abstract

Provided is a three-dimensional-endoscope optical system that is provided with two objective optical systems having optical axes, which are arranged with a spacing therebetween, and that satisfies the following conditions:0.5 mm<OP<1.5 mm  (1);3 mm<D<200 mm  (2);α<10°  (3); and110°<ω<180°  (4),where OP is a spacing between the optical axes of optical members at the most distal ends of the objective optical systems, D is a depth of field, α is an angle of convergence (inward angle) of the depth of field D when performing near-point observation, and ω is an angle of view of the objective optical systems.


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