The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Feb. 04, 2016
Applicant:

Octrolix Bv, Enschede, NL;

Inventors:

Frederik Schreuder, Rijssen, NL;

Rene Gerrit Heideman, Oldenzaal, NL;

Assignee:

LioniX International BV, Enschede, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/26 (2006.01); G02B 6/293 (2006.01); G01N 21/45 (2006.01); G01N 21/77 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G02B 6/29343 (2013.01); G01N 21/45 (2013.01); G01N 21/7746 (2013.01); G02B 6/29355 (2013.01); G01N 2021/399 (2013.01); G01N 2021/7716 (2013.01); G01N 2021/7776 (2013.01); G01N 2021/7779 (2013.01);
Abstract

A multi-path interferometric sensor for sensing small changes in the refractive index of sensing arms thereof, such as caused by the presence of an analyte or changes in analyte concentration, is disclosed. The sensor includes a single light source, a single detector, and a plurality of interferometers or a single multi-path interferometer. The various sensing branches within the multi-path interferometric sensor each include a delay having a different length. This results in a different modulation frequency for each interferometer, each of carriers include phase information that correlates to a change in refractive index and, ultimately, analyte concentration. The plural carrier frequencies enable simultaneous detection of multiple samples.


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