The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Sep. 12, 2011
Applicant:

Kazuhiko Momoki, Koshigaya, JP;

Inventor:

Kazuhiko Momoki, Koshigaya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 1/115 (2015.01); G02B 5/04 (2006.01); G02B 1/118 (2015.01); G02B 5/28 (2006.01);
U.S. Cl.
CPC ...
G02B 1/115 (2013.01); G02B 1/118 (2013.01); G02B 5/045 (2013.01); G02B 5/285 (2013.01);
Abstract

An optical element having antireflection function includes a substrate including a first relief structure, which includes a plurality of convexes and a plurality of concaves arrayed with a pitch of at most a half of a wavelength λ. A thin film layer including at least one thin film on the first relief structure. The at least one thin film each has a refractive index lower than a refractive index of the substrate. The optical element satisfies the following conditional expression: 1/4 ≦h/h≦and 1/5 λ≦D≦λ, where hrepresents a first height difference between a top and a bottom of the first relief structure in a normal direction of a bottom plane of the first relief structure, hrepresents a second height difference between a top and a bottom of the second relief structure in the normal direction, D represents a maximum thickness of the thin film layer, and the wavelength λ is 550 nm.


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