The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Mar. 03, 2016
International Business Machines Corporation, Armonk, NY (US);
Chen-Yong Cher, Port Chester, NY (US);
Keith A. Jenkins, Sleepy Hollow, NY (US);
Barry P. Linder, Hastings-on-Hudson, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Method of measuring semiconductor device leakage which includes: providing a semiconductor device powered by a supply voltage and having a circuit block of transistors; providing on the semiconductor device a test circuit providing an input to a counter and a fixed-frequency measurement clock to provide a clock signal to the counter; disconnecting a system clock from the circuit block; receiving by the test circuit the supply voltage as an input; initializing the counter; starting the counter when the supply voltage is at or below a first voltage V; monitoring a decrease of the supply voltage with time; stopping the counter when the supply voltage is at or below a second voltage Vsuch that Vis greater than V; and reading the counter to provide the semiconductor device leakage metric. Also disclosed is an apparatus and a computer program product.