The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Mar. 31, 2015
Applicant:

Hitachi High-tech Science Corporation, Minato-ku, Tokyo, JP;

Inventor:

Yoshiki Matoba, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 15/06 (2006.01); G01N 23/083 (2006.01); G01N 23/16 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/083 (2013.01); G01N 23/043 (2013.01); G01N 23/16 (2013.01); G01N 2223/04 (2013.01); G01N 2223/505 (2013.01); G01N 2223/642 (2013.01); G01N 2223/652 (2013.01);
Abstract

An X-ray transmission inspection apparatus includes: an X-ray source configured to irradiate a sample with an X-ray; a detector configured to be disposed on a side opposite to the X-ray source with respect to the sample and to detect the X-ray which is transmitted through the sample using a phosphor; a shield member configured to be arranged to face a detection surface of the detector and to block a part of X-rays to partially form a shield area from the X-rays on the detection surface; and a shield moving mechanism configured to move the shield member relative to the detector to enable change of a position of the shield area.


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