The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Aug. 10, 2017
Trioptics Gmbh, Wedel, DE;
TRIOPTICS GMBH, Wedel, DE;
Abstract
In a method for measuring the positions of centers of curvature of optical surfaces of a single- or multi-lens optical system, an imaging lens system images an object plane into a first and a second image plane. The first image plane is produced by a first ancillary lens system having a first focal length and defining a first beam path, while the second image plane is produced by a second ancillary lens system having a second focal length that is different from the first focal length and defining a second beam path that is different from the first beam path. An object arranged in the object plane is then imaged simultaneously or sequentially at the first and the second image plane by means of measuring light. Reflections of the measuring light at optical surfaces of the optical system are detected by means of a spatially resolving light sensor. The actual positions of the first and the second center of curvature are calculated from the detected reflexes.