The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Jul. 19, 2013
Olympus Corporation, Tokyo, JP;
Tetsuya Tanabe, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
In the scanning molecule counting method using the light measurement with a confocal microscope or a multiphoton microscope, a measuring time is optimized with suppressing the scattering in a result small irrespective of light-emitting particle concentrations. In the inventive technique of detecting and analyzing the light from an light-emitting particle, there are repeated processes of detecting the light intensity from a light detection region with moving the position of the light detection region of an optical system in a sample solution by changing the optical path of the optical system of the microscope, and detecting the signals of the light of light-emitting particles individually, and based on the time taken for the number of the signals from the light-emitting particles to reach a predetermined number, the light-emitting particle concentration in the sample solution is determined.