The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Apr. 23, 2013
Snecma, Paris, FR;
Maurice Georges Vernochet, La Rochette, FR;
SNECMA, Paris, FR;
Abstract
The invention relates to a temperature measurement method using a thermometric resistance-type temperature probe () comprising at least two electroconductive sensitive elements () on the same substrate (), wherein different parameters representative of the strength of the electric current circulating in one of said sensitive elements () are measured, and a correction, according to said strength of the electric current circulating in said sensitive element (), is applied to a signal representative of a temperature measurement generated from the other one of said sensitive elements (), in order to correct an error created as a result of the self-heating by the Joule effect of said sensitive element () affecting the other one of said sensitive elements ().