The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Nov. 07, 2014
Applicant:

Lenterra, Inc., Newark, NJ (US);

Inventors:

Valery Sheverev, West Orange, NJ (US);

Vadim Stepaniuk, Bloomfield, NJ (US);

Assignee:

Lenterra, Inc., Newark, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/30 (2006.01); G01F 1/74 (2006.01); G01D 5/26 (2006.01); G01F 1/28 (2006.01);
U.S. Cl.
CPC ...
G01F 1/30 (2013.01); G01D 5/268 (2013.01); G01F 1/74 (2013.01);
Abstract

Flow sensors, systems, and methods for continuous in situ monitoring of a rheologically complex fluid flow within a vessel, such as particulate and multiphase media for ascertaining certain fluid flow parameters, such as flow rate, dynamic viscosity, fluid density, fluid temperature, particle density and particle mass, from flow sensor measurements. The system involves a fluid flow sensor having a body member with internalized strain gauges configured to measure the deformation of certain segments of the body member. Based, at least in part, on these deformation measurements, the system is used to compute the fluid flow parameters.


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