The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Aug. 10, 2016
Dr. Johannes Heidenhain Gmbh, Traunreut, DE;
Wolfgang Holzapfel, Obing, DE;
Christoph Lingk, Traunstein, DE;
Johannes Trautner, Traunwalchen, DE;
DR. JOHANNES HEIDENHAIN GmbH, Traunreut, DE;
Abstract
An optical position-measuring device for absolute position determination includes a material measure extending along a measurement direction and including an incremental graduation and an absolute code. A scanning unit movable relative to the material measure has a light source, a scanning grating for optically scanning the incremental graduation and a detector device. The detector device includes an incremental detector for generating incremental signals from the optical scanning of the incremental graduation and an absolute detector for generating absolute signals from optical scanning of the absolute code. A common detection plane is located at a defined perpendicular distance from the scanning grating and/or a periodicity of a fringe pattern on the incremental detector is selected such that, in the event of scattering contamination in a region of the material measure and/or the scanning grating, amplitudes of the incremental signals and the absolute signals drop off equally.