The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Jun. 21, 2016
Applicant:

Sumitomo Electric Hardmetal Corp., Itami-shi, JP;

Inventors:

Hideaki Kanaoka, Sorachi-gun, JP;

Shinya Imamura, Sorachi-gun, JP;

Anongsack Paseuth, Sorachi-gun, JP;

Takanori Detani, Sorachi-gun, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23B 27/14 (2006.01); C30B 29/20 (2006.01); C23C 16/36 (2006.01); C30B 28/14 (2006.01);
U.S. Cl.
CPC ...
C30B 29/20 (2013.01); B23B 27/148 (2013.01); C23C 16/36 (2013.01); C30B 28/14 (2013.01); B23B 2224/04 (2013.01); B23B 2224/28 (2013.01); B23B 2224/36 (2013.01); B23B 2228/04 (2013.01); B23B 2228/105 (2013.01);
Abstract

A surface-coated cutting tool includes a base material and a coating formed on the base material. The coating includes an α-AlOlayer. The α-AlOlayer contains a plurality of α-AlOcrystal grains and a plurality of κ-AlOcrystal grains, and has a TC(006) of more than 5 in a texture coefficient TC(hkl). A ratio of Cto a sum of Cand C: [C/(C+C)×100](%) is 0.05 to 7%, where Cis a total number of peak counts of the α-AlOcrystal grains obtained from measurement data of x-ray diffraction for the coating, and Cis a total number of peak counts of the κ-AlOcrystal grains obtained from the measurement data of the x-ray diffraction for the coating.


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