The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Jun. 25, 2013
Dow Agrosciences Llc, Indianapolis, IN (US);
Lauren Clark, Whitestown, IN (US);
Kelley Ann Smith, Lebanon, IN (US);
Yang Wang, Johnston, IA (US);
Ning Zhou, Zionsville, IN (US);
Dow AgroSciences LLC, Indianapolis, IN (US);
Abstract
Soybean Event pDAB9582.816.15.1 comprises gene expression cassettes which contain genes encoding Cry1F, Cry1Ac (synpro), and PAT, affording insect resistance and herbicide tolerance to soybean crops containing the event, and enabling methods for crop protection and protection of stored products. The disclosure provides polynucleotide related event detection methods. The present disclosure relates to a method for detecting a new insect resistant and herbicide tolerant transgenic soybean transformation event, designated Soybean Event pDAB9582.816.15,1. The DNA of soybean plants containing this event includes the junction/flanking sequences described herein that characterize the location of the inserted DNA within the soybean genome. SEQ ID NO: 1 and SEQ ID N0:2 are diagnostic for Soybean Event pDAB9582.816.15.1.