The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Oct. 17, 2011
Applicant:

Ewald Rössl, Ellerau, DE;

Inventor:

Ewald Rössl, Ellerau, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G21K 1/06 (2006.01); G01N 23/04 (2006.01); A61B 6/03 (2006.01); G01N 23/20 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/032 (2013.01); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); G01N 23/046 (2013.01); G01N 23/20075 (2013.01); G21K 1/06 (2013.01); G21K 1/067 (2013.01); A61B 6/06 (2013.01);
Abstract

The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to provide enhanced phase-gradient based image data, a diffraction grating () for X-ray differential phase-contrast imaging, is provided with a first sub-area () comprising at least one portion () of a first grating structure () and at least one portion () of a second grating structure (). The first grating structure comprises a plurality of bars () and gaps () with a first grating orientation G(), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second grating structure comprises a plurality of bars () and gaps () with a second grating orientation G(), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The first grating orientation Gis different than the second grating orientation G. Thus, phase-gradient based image information can be acquired for different directions without the necessity to rotate or pivot any of the respective gratings between the acquisition steps, for example.


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