The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Jun. 17, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seung-woo Shin, Yongin-si, KR;

Jeong-hwan Kim, Seoul, KR;

Do-kwan Oh, Suwon-si, KR;

Dong-jae Lee, Hwaseong-si, KR;

Sang-chul Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/02 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4441 (2013.01); A61B 6/4435 (2013.01); A61B 6/4452 (2013.01); A61B 6/5205 (2013.01); A61B 6/5241 (2013.01); A61B 6/548 (2013.01);
Abstract

An X-ray apparatus includes: a source configured to emit X-rays to an object; a detector configured to detect the X-rays that have penetrated the object; an arm configured to connect the source to the detector and move centering on a stand fixed to a bottom; a controller configured to control a movement of the arm so that the controller changes a direction of the X-rays, which are radiated to the object, and the arm rotates on the stand to move the detector in a first direction, to obtain images for a plurality of parts of the object; and an image processor configured to obtain the images for the plurality of parts of the object based on the X-rays detected by the detector.


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