The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2018
Filed:
Sep. 08, 2014
Riken, Saitama, JP;
Masaki Yumoto, Ibaraki, JP;
Koji Miyazaki, Tokyo, JP;
Satoshi Wada, Saitama, JP;
Takayo Ogawa, Saitama, JP;
Shinichi Imai, Tokyo, JP;
RIKEN, Saitama, JP;
Abstract
To provide a gas analysis device comprising: a cell; a light source; and a detector, wherein two or more types of gaseous components contained in the gas are measurement targets, a mid-infrared light with a wavelength that is caused to match the absorption spectrum of the measurement target gaseous components is output from the light source, and concentrations of the gaseous components are obtained based on light intensity detected by the detector. The gas analysis device sets a cumulative measurement time for the mid-infrared lights with the wavelengths for respective ones of the measurement target gaseous components; and controls at least one of an output time of the light source and a detection time of the detector in accordance with the cumulative measurement times, thereby efficiently measuring the plurality of types of gaseous components contained in the gas by using the mid-infrared lights with the plurality of wavelengths.