The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Jul. 05, 2011
Applicants:

Takuro Tanaka, Chiba, JP;

Yasuhiko Nakagawa, Chiba, JP;

Hiroyuki Iizuka, Chiba, JP;

Koji Ohguma, Chiba, JP;

Mikio Yamahiro, Chiba, JP;

Inventors:

Takuro Tanaka, Chiba, JP;

Yasuhiko Nakagawa, Chiba, JP;

Hiroyuki Iizuka, Chiba, JP;

Koji Ohguma, Chiba, JP;

Mikio Yamahiro, Chiba, JP;

Assignee:

JNC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 1/03 (2006.01); G06F 3/044 (2006.01); H05K 3/00 (2006.01); C08J 7/04 (2006.01);
U.S. Cl.
CPC ...
H05K 1/0313 (2013.01); C08J 7/042 (2013.01); G06F 3/044 (2013.01); H05K 3/0064 (2013.01); C08J 2367/02 (2013.01); C08J 2433/00 (2013.01); G06F 2203/04103 (2013.01); Y10T 156/10 (2015.01); Y10T 428/1055 (2015.01);
Abstract

Provided is a transparent conductive film having multilayer structure, and inconspicuous pattern shape and good visibility. The film includes: transparent baseformed of film-like polymer resin; first hard coat layerlaminated on the base; first transparent dielectric layerlaminated as required on the layer; and first transparent conductive layerlaminated on the layer. The basehas a film thickness of 2 to 250 micrometers. The layeris formed of hardening resin containing inorganic oxide, with refractive index: 1.40 to 1.90 and film thickness: 0.5 to 6 micrometers. The layeris formed of inorganic substance, with refractive index: 1.30 to 1.50 and film thickness: 10 to 50 nanometers. The layeris formed of at least one kind of inorganic oxide, metal and carbon, and patterned, and has a film thickness of 10 nanometers to 2 micrometers.


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