The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Jun. 30, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

D. Amnon Silverstein, Palo Alto, CA (US);

Jaewon Shin, Mountain View, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/217 (2011.01); G06T 7/00 (2017.01); G06T 3/40 (2006.01); G06T 1/20 (2006.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2176 (2013.01); G06T 1/20 (2013.01); G06T 3/4015 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20024 (2013.01);
Abstract

Embodiments of the present disclosure relate to a sensor interface circuit that performs scaling of image data in a Bayer pattern without spreading defective pixels across multiple pixels. The sensor interface circuit may include a register circuit storing operating parameters of the sensor interface circuit. The sensor interface circuit includes a scaling circuit with a first defect pixel detection circuit to detect a first defective pixel in an input image by analyzing pixels in a line of an input image data along a first direction. A first scaling circuit is coupled to the first defect pixel detection circuit and generates a scaled line of pixels representing the line of the input image scaled along the first direction according to the operating parameters.


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