The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Nov. 02, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Shuichi Kurokawa, Saitama, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Provided is an optical scanning apparatus, including: a deflector which deflects light beams with first and second deflection surfaces to scan first and second scanned surfaces in a main scanning direction; first and second imaging optical systems which guide the deflected light beams to the first and second scanned surfaces; and an incident optical system which allows the light beam to obliquely enter the first deflection surface in a sub-scanning section, in which the first imaging optical system includes a first optical element having an absolute value of curvature radius of incident surface smaller than an absolute value of curvature radius of exit surface in the sub-scanning section including an optical axis, and the incident surface of the first optical element reflects the light beam entering the incident surface toward a direction of separating from a main scanning section including the deflector in the sub-scanning section including the optical axis.