The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Sep. 23, 2016
Applicants:

Wai Wu, Massapequa, NY (US);

Steven M. Hoffberg, West Harrison, NY (US);

Inventors:

Wai Wu, Massapequa, NY (US);

Steven M. Hoffberg, West Harrison, NY (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04M 3/00 (2006.01); H04M 5/00 (2006.01); H04M 15/00 (2006.01); H04M 3/523 (2006.01); H04M 3/42 (2006.01);
U.S. Cl.
CPC ...
H04M 15/8061 (2013.01); H04M 3/42068 (2013.01); H04M 3/5233 (2013.01); H04M 3/5238 (2013.01);
Abstract

A method for matching a first entity with at least one second entity selected from a plurality of second entities, comprising defining a plurality of multivalued scalar data representing inferential targeting parameters for the first entity and a plurality of multivalued scalar data of each of the plurality of second entities, representing respective characteristic parameters for each respective second entity; and performing an automated optimization with respect to an economic surplus of a respective match of the first entity with the at least one of the plurality of second entities, and an opportunity cost of the unavailability of the at least one of the plurality of second entities for matching with an alternate first entity.


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