The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Jul. 31, 2016
Applicant:

At&t Intellectual Property Ii, L.p., Atlanta, GA (US);

Inventors:

Nicholas Duffield, Summit, NJ (US);

Balachander Krishnamurthy, New York, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01); H04L 12/859 (2013.01); G06Q 10/06 (2012.01); H04L 12/26 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 47/2475 (2013.01); G06Q 10/063 (2013.01); H04L 43/10 (2013.01); H04L 43/50 (2013.01); H04L 67/025 (2013.01);
Abstract

Described is a system and method for determining a classification of an application that includes initiating a stress test on the application, the stress test including a predetermined number of stress events, wherein the stress events are based on a network impairment. A response by the application to each stress event is identified and the application is classified as a function of the response into one of a first classification and a second classification, the first classification indicative of a normal application and the second classification indicative of an undesired application. If, the application is in the second classification, a network response procedure is executed.


Find Patent Forward Citations

Loading…