The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Jun. 08, 2016
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Xiaofei Zeng, Shenzhen, CN;

Sanzhong Li, Shenzhen, CN;

Gang Zheng, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/07 (2013.01); H04B 10/079 (2013.01); H04B 10/27 (2013.01);
U.S. Cl.
CPC ...
H04B 10/0793 (2013.01); H04B 10/07 (2013.01); H04B 10/0795 (2013.01); H04B 10/27 (2013.01);
Abstract

An apparatus and a method for detecting an uplink optical signal. The apparatus includes a memory and a processor, where the processor is configured to determine a remaining bandwidth in a target uplink frame as a test window, where the remaining bandwidth in the target uplink frame indicates an unallocated bandwidth in the target uplink frame, and detect an uplink optical signal in the determined test window. Therefore, a remaining bandwidth obtained after bandwidth allocation in a target uplink frame is used to detect an uplink optical signal, which can effectively use a resource without the need of independently opening a test window and using an extra resource to detect the uplink optical signal, thereby avoiding waste of a resource and improving test efficiency.


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