The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

May. 24, 2016
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Jochen Hilsenbeck, Villach, AT;

Jens Peter Konrath, Villach, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/66 (2006.01); H01L 27/08 (2006.01); H01L 21/8232 (2006.01); H01L 21/265 (2006.01); H01L 21/66 (2006.01); H01L 21/04 (2006.01); H01L 29/47 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66143 (2013.01); H01L 21/265 (2013.01); H01L 21/8232 (2013.01); H01L 22/10 (2013.01); H01L 22/20 (2013.01); H01L 27/0814 (2013.01); H01L 21/0495 (2013.01); H01L 29/47 (2013.01); H01L 29/475 (2013.01); H01L 29/6606 (2013.01); H01L 29/66212 (2013.01);
Abstract

A method for forming a plurality of semiconductor devices on a plurality of semiconductor wafers includes forming an electrically conductive layer on a surface of a first semiconductor wafer so that a Schottky-contact is generated between the electrically conductive layer formed on the first semiconductor wafer and the first semiconductor wafer. The method further includes forming an electrically conductive layer on a surface of a second semiconductor wafer so that a Schottky-contact is generated between the electrically conductive layer formed on the second semiconductor wafer and the second semiconductor wafer. A material composition of the electrically conductive layers formed on the first and second semiconductor wafers are selected based on a value of the physical property of the first and second semiconductor wafers, respectively. The material composition of the electrically conductive layers formed on the first and second semiconductor wafers are different.


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