The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Dec. 23, 2014
Applicants:

Nuctech Company Limited, Beijing, CN;

Tsinghua University, Beijing, CN;

Inventors:

Huaping Tang, Beijing, CN;

Chuanxiang Tang, Beijing, CN;

Huaibi Chen, Beijing, CN;

Assignees:

NUCTECH COMPANY LIMITED, Beijing, CN;

TSINGHUA UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 5/18 (2006.01); H01J 35/14 (2006.01); G01N 23/04 (2006.01); G21K 1/02 (2006.01); H01J 35/16 (2006.01);
U.S. Cl.
CPC ...
H01J 35/14 (2013.01); G01N 23/043 (2013.01); G21K 1/02 (2013.01); H01J 35/16 (2013.01); H01J 2235/166 (2013.01);
Abstract

The present invention provides an X-ray generating apparatus and an X-ray fluoroscopy imaging system comprising the same. The X-ray generating apparatus comprises: an electron accelerator including an electron acceleration unit, an electron emission unit, and a target; a shielding and collimating device, including a shielding structure and a collimator arranged in the shielding structure, wherein the target is surrounded by the shielding structure, the collimator is arranged in a direction passing through the target point and forming an angle from 30 degrees to 150 degrees with the electron beam shooting the target.


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