The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Dec. 16, 2014
Applicant:

Kabushiki Kaisha Toshiba, Minato-Ku, JP;

Inventors:

Tadao Konishi, Fuchu, JP;

Motoko Yoshida, Kawasaki, JP;

Naoto Odagawa, Hachioji, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G05B 23/02 (2006.01); G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G05B 23/0272 (2013.01); G21C 17/00 (2013.01); G05B 2219/31316 (2013.01);
Abstract

A test support apparatus for a plant monitoring system, includes: a list holding unit configured to hold a test list which describes at least a plurality of test items and information about a testing sequence for the test items; a screen generating unit configured to generate a display screen provided based on an output signal from a control unit which controls a plurality of connected devices; a data acquisition instructing unit configured to give instructions to acquire image data of the display screen based on the testing sequence in the test list; and a data linking unit configured to link the acquired image data to the test items on the test list.


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