The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Sep. 23, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Victor Chan, Del Mar, CA (US);

Alok Govil, Fremont, CA (US);

Gerhard Reitmayr, Vienna, AT;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6201 (2013.01); G06K 9/46 (2013.01); G06K 9/6267 (2013.01); G06K 2009/4666 (2013.01);
Abstract

Methods, systems, computer-readable media, and apparatuses for incremental object detection using a staged process and a band-pass feature extractor are presented. At each stage of the staged process, a different band of features from a plurality of bands of features in image data can be extracted using a dual-threshold local binary pattern operator, and compared with features of a target object within the band for a partial decision. The staged process exits if a rejection decision is made at any stage of the staged process. If no rejection decision is made in each stage of the staged process, the target object is detected. Features extracted at each stage may be from a different image for some applications.


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