The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Mar. 27, 2015
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Eran Marcus, Culver City, CA (US);

David U. Fluckiger, Allen, TX (US);

Brian F Boland, Redondo Beach, CA (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/15 (2006.01); G01S 17/10 (2006.01); G01S 7/486 (2006.01); G06F 17/14 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30336 (2013.01); G01S 7/486 (2013.01); G01S 17/10 (2013.01); G06F 17/142 (2013.01); G06F 17/15 (2013.01); G06F 17/3053 (2013.01);
Abstract

A method for computing a cross-correlation between a first sequence and a second sequence includes: generating a first index vector based on the first sequence, the first index vector including a plurality of first elements, the first index vector excluding indices of zero valued elements of the first sequence; generating a second index vector based on the second sequence, the second index vector including a plurality of second elements, the second index vector excluding indices of zero valued elements of the second sequence; computing, on a processor, a plurality of pairwise differences between each of first elements of the first index vector and each of the second elements of the second index vector; and binning, on the processor, the plurality of pairwise differences to generate the cross-correlation of the first sequence and the second sequence.


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