The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Nov. 21, 2016
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Girish Raghavan, Chennai, IN;

Thamilchelvi Peterbarnabas, Chennai, IN;

Deepashree Mohan, Bangalore, IN;

Assignee:

WIPRO LIMITED, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 8/10 (2013.01); G06F 11/3664 (2013.01);
Abstract

The present disclosure is related in general to software testing and a method and a system for generating a valid set of test configurations for test scenarios. A test configuration generation system retrieves one or more test parameters from each of one or more test scenarios associated with a corresponding requirement and a requirement criticality. Further, the test configuration generation system identities data values corresponding to each of the one or more test parameters. Further, it generates a valid set of test configurations for each test scenario based on requirement risk and eliminates one or more invalid test configuration combinations detected and finally a valid set of test configurations for each test scenario is generated. The present disclosure ensures right coverage with right set of configurations that can be executed within the limited time available and reduces 80% of manual efforts in generating the test configurations.


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Raghavan, Girish. (2018). Method and system for generation a valid set of test configurations for test scenarios (U.S. Patent No. 9858175). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9858175

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